Quantitative elemental composition with a sensitivity down to 1 – 0.1 atomic %.Identification of all elements above lithium on the periodic table.provide direct measurement of mass as time progresses, with a resolution well below a single layer of atoms.provide reliable measurements of small mass changes at a surface.provide characterisation of self-assembled monolayers (SAMs).thin film thickness measurements (such as native oxides, i.e.provide depth profiling of both organic and inorganic materials for thin film composition. determine composition and chemical state information of surfaces.
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